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Researcher profile

E. Strizhevsky

E. Strizhevsky contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
physics.opticseess.IV

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Published work

2 published item(s)

preprint2020arXiv

High-speed x-ray imaging with single-pixel detector

We demonstrate experimentally the ability to use a single pixel detector for two-dimensional high-speed and high-resolution x-ray imaging. We image the rotation of a spinning chopper at 100-kHz at spatial resolution of about 15 microns by using the computational ghost imaging approach. The technique we develop can be used for the imaging of high-speed periodic dynamics or periodically stimulated effects with a large field of view and at low dose.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

Observation of strong nonlinear interactions in parametric down-conversion of x-rays into ultraviolet radiation

Nonlinear interactions between x-rays and long wavelengths can be used as a powerful atomic scale probe for light-matter interactions and for properties of valence electrons. This probe can provide novel microscopic information in solids that existing methods cannot reveal, hence to advance the understanding of many phenomena in condensed matter physics. However, thus far, reported x-ray nonlinear effects were very small and their observations required tremendous efforts. Here we report the observation of unexpected strong nonlinearities in parametric down-conversion (PDC) of x-rays to long wavelengths in gallium arsenide (GaAs) and in lithium niobate (LiNbO3) crystals, with efficiencies that are about 4 orders of magnitude stronger than the efficiencies measured in any material studied before. These strong nonlinearities cannot be explained by any known theory and indicate on possibilities for the development of a new spectroscopy method that is orbital and band selective. In this work we demonstrate the ability to use PDC of x-rays to investigate the spectral response of materials in a very broad range of wavelengths from the infrared regime to the soft x-ray regime.

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