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E. B. Kley

E. B. Kley contributes to research discovery and scholarly infrastructure.

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physics.optics cond-mat.mtrl-sci

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preprint2011arXiv

Sparsity-based single-shot sub-wavelength coherent diffractive imaging

We present the experimental reconstruction of sub-wavelength features from the far-field intensity of sparse optical objects: sparsity-based sub-wavelength imaging combined with phase-retrieval. As examples, we demonstrate the recovery of random and ordered arrangements of 100 nm features with the resolution of 30 nm, with an illuminating wavelength of 532 nm. Our algorithmic technique relies on minimizing the number of degrees of freedom; it works in real-time, requires no scanning, and can be implemented in all existing microscopes - optical and non-optical.

preprint2010arXiv

Far-Field Microscopy of Sparse Subwavelength Objects

We present the experimental reconstruction of sub-wavelength features from the far-field of sparse optical objects. We show that it is sufficient to know that the object is sparse, and only that, and recover 100 nm features with the resolution of 30 nm, for an illuminating wavelength of λ=532 nm. Our technique works in real-time, requires no scanning, and can be implemented in all existing microscopes - optical and non-optical.

preprint2010arXiv

Investigation of mechanical losses of thin silicon flexures at low temperatures

The investigation of the mechanical loss of different silicon flexures in a temperature region from 5 to 300 K is presented. The flexures have been prepared by different fabrication techniques. A lowest mechanical loss of $3\times10^{-8}$ was observed for a 130 $μ$m thick flexure at around 10 K. While the mechanical loss follows the thermoelastic predictions down to 50 K a difference can be observed at lower temperatures for different surface treatments. This surface loss will be limiting for all applications using silicon based oscillators at low temperatures. The extraction of a surface loss parameter using different results from our measurements and other references is presented. We focused on structures that are relevant for gravitational wave detectors. The surface loss parameter $α_s$ = 0.5 pm was obtained. This reveals that the surface loss of silicon is significantly lower than the surface loss of fused silica.

E. B. Kley

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3 published item(s)

Sparsity-based single-shot sub-wavelength coherent diffractive imaging

Far-Field Microscopy of Sparse Subwavelength Objects

Investigation of mechanical losses of thin silicon flexures at low temperatures