Researcher profile

Damon L. Woodard

Damon L. Woodard contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

A Survey and Perspective on Artificial Intelligence for Security-Aware Electronic Design Automation

Artificial intelligence (AI) and machine learning (ML) techniques have been increasingly used in several fields to improve performance and the level of automation. In recent years, this use has exponentially increased due to the advancement of high-performance computing and the ever increasing size of data. One of such fields is that of hardware design; specifically the design of digital and analog integrated circuits~(ICs), where AI/ ML techniques have been extensively used to address ever-increasing design complexity, aggressive time-to-market, and the growing number of ubiquitous interconnected devices (IoT). However, the security concerns and issues related to IC design have been highly overlooked. In this paper, we summarize the state-of-the-art in AL/ML for circuit design/optimization, security and engineering challenges, research in security-aware CAD/EDA, and future research directions and needs for using AI/ML for security-aware circuit design.

preprint2020arXiv

Histogram-based Auto Segmentation: A Novel Approach to Segmenting Integrated Circuit Structures from SEM Images

In the Reverse Engineering and Hardware Assurance domain, a majority of the data acquisition is done through electron microscopy techniques such as Scanning Electron Microscopy (SEM). However, unlike its counterparts in optical imaging, only a limited number of techniques are available to enhance and extract information from the raw SEM images. In this paper, we introduce an algorithm to segment out Integrated Circuit (IC) structures from the SEM image. Unlike existing algorithms discussed in this paper, this algorithm is unsupervised, parameter-free and does not require prior information on the noise model or features in the target image making it effective in low quality image acquisition scenarios as well. Furthermore, the results from the application of the algorithm on various structures and layers in the IC are reported and discussed.