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Daiki Ikami

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Computer Vision Machine Learning

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preprint2021arXiv

A Novel Perspective for Positive-Unlabeled Learning via Noisy Labels

Positive-unlabeled learning refers to the process of training a binary classifier using only positive and unlabeled data. Although unlabeled data can contain positive data, all unlabeled data are regarded as negative data in existing positive-unlabeled learning methods, which resulting in diminishing performance. We provide a new perspective on this problem -- considering unlabeled data as noisy-labeled data, and introducing a new formulation of PU learning as a problem of joint optimization of noisy-labeled data. This research presents a methodology that assigns initial pseudo-labels to unlabeled data which is used as noisy-labeled data, and trains a deep neural network using the noisy-labeled data. Experimental results demonstrate that the proposed method significantly outperforms the state-of-the-art methods on several benchmark datasets.

preprint2020arXiv

Multi-Task Curriculum Framework for Open-Set Semi-Supervised Learning

Semi-supervised learning (SSL) has been proposed to leverage unlabeled data for training powerful models when only limited labeled data is available. While existing SSL methods assume that samples in the labeled and unlabeled data share the classes of their samples, we address a more complex novel scenario named open-set SSL, where out-of-distribution (OOD) samples are contained in unlabeled data. Instead of training an OOD detector and SSL separately, we propose a multi-task curriculum learning framework. First, to detect the OOD samples in unlabeled data, we estimate the probability of the sample belonging to OOD. We use a joint optimization framework, which updates the network parameters and the OOD score alternately. Simultaneously, to achieve high performance on the classification of in-distribution (ID) data, we select ID samples in unlabeled data having small OOD scores, and use these data with labeled data for training the deep neural networks to classify ID samples in a semi-supervised manner. We conduct several experiments, and our method achieves state-of-the-art results by successfully eliminating the effect of OOD samples.