Researcher profile

D. M. Evans

D. M. Evans contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

Strain driven conducting domain walls in a Mott insulator

Rewritable nanoelectronics offers new perspectives and potential to both fundamental research and technological applications. Such interest has driven the research focus into conducting domain walls: pseudo 2D conducting channels that can be created, positioned, and deleted in situ. However, the study of conductive domain walls is largely limited to wide-gap ferroelectrics, where the conductivity typically arises from changes in charge carrier density, due to screening charge accumulation at polar discontinuities. This work shows that, in narrow-gap correlated insulators with strong charge lattice coupling, local strain gradients can drive enhanced conductivity at the domain walls, removing polar discontinuities as a criteria for conductivity. By combining different scanning probe microscopy techniques, we demonstrate that the domain wall conductivity in GaV4S8 does not follow the established screening charge model but rather arises from the large surface reconstruction across the Jahn-Teller transition and the associated strain gradients across the domain walls. This mechanism can turn any structural, or even magnetic, domain wall conducting, if the electronic structure of the host is susceptible to local strain gradients, drastically expanding the range of materials and phenomena that may be applicable to domain wall based nanoelectronics.

preprint2020arXiv

Controlling local resistance via electric-field induced dislocations

Dislocations are one-dimensional (1D) topological line defects where the lattice deviates from the perfect crystal structure. The presence of dislocations transcends condensed matter research and gives rise to a diverse range of emergent phenomena [1-6], ranging from geological effects [7] to light emission from diodes [8]. Despite their ubiquity, to date, the controlled formation of dislocations is usually achieved via strain fields, applied either during growth [9,10] or retrospectively via deformation, e.g., (nano [11-14])-indentation [15]. Here we show how partial dislocations can be induced using local electric fields, altering the structure and electronic response of the material where the field is applied. By combining high-resolution imaging techniques and density functional theory calculations, we directly image these dislocations in the ferroelectric hexagonal manganite Er(Ti,Mn)O3 and study their impact on the local electric transport behaviour. The use of an electric field to induce partial dislocations is a conceptually new approach to the burgeoning field of emergent defect-driven phenomena and enables local property control without the need of external macroscopic strain fields. This control is an important step towards integrating and functionalising dislocations in practical devices for future oxide electronics.