Source author record

Chong Xie

Chong Xie appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

2works
3topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2020arXiv

Clustering with Fast, Automated and Reproducible assessment applied to longitudinal neural tracking

Across many areas, from neural tracking to database entity resolution, manual assessment of clusters by human experts presents a bottleneck in rapid development of scalable and specialized clustering methods. To solve this problem we develop C-FAR, a novel method for Fast, Automated and Reproducible assessment of multiple hierarchical clustering algorithms simultaneously. Our algorithm takes any number of hierarchical clustering trees as input, then strategically queries pairs for human feedback, and outputs an optimal clustering among those nominated by these trees. While it is applicable to large dataset in any domain that utilizes pairwise comparisons for assessment, our flagship application is the cluster aggregation step in spike-sorting, the task of assigning waveforms (spikes) in recordings to neurons. On simulated data of 96 neurons under adverse conditions, including drifting and 25\% blackout, our algorithm produces near-perfect tracking relative to the ground truth. Our runtime scales linearly in the number of input trees, making it a competitive computational tool. These results indicate that C-FAR is highly suitable as a model selection and assessment tool in clustering tasks.

preprint2009arXiv

Nanoscale Electronic Inhomogeneity in In2Se3 Nanoribbons Revealed by Microwave Impedance Microscopy

Driven by interactions due to the charge, spin, orbital, and lattice degrees of freedom, nanoscale inhomogeneity has emerged as a new theme for materials with novel properties near multiphase boundaries. As vividly demonstrated in complex metal oxides and chalcogenides, these microscopic phases are of great scientific and technological importance for research in high-temperature superconductors, colossal magnetoresistance effect, phase-change memories, and domain switching operations. Direct imaging on dielectric properties of these local phases, however, presents a big challenge for existing scanning probe techniques. Here, we report the observation of electronic inhomogeneity in indium selenide (In2Se3) nanoribbons by near-field scanning microwave impedance microscopy. Multiple phases with local resistivity spanning six orders of magnitude are identified as the coexistence of superlattice, simple hexagonal lattice and amorphous structures with 100nm inhomogeneous length scale, consistent with high-resolution transmission electron microscope studies. The atomic-force-microscope-compatible microwave probe is able to perform quantitative sub-surface electronic study in a noninvasive manner. Finally, the phase change memory function in In2Se3 nanoribbon devices can be locally recorded with big signal of opposite signs.