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C. Neumann

C. Neumann contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2020arXiv

Giant persistent photoconductivity in monolayer MoS2 field-effect transistors

Monolayer transition metal dichalcogenides (TMD) have numerous potential applications in ultrathin electronics and photonics. The exposure of TMD based devices to light generates photo-carriers resulting in an enhanced conductivity, which can be effectively used, e.g., in photodetectors. If the photo-enhanced conductivity persists after removal of the irradiation, the effect is known as persistent photoconductivity (PPC). Here we show that ultraviolet light (wavelength = 365 nm) exposure induces an extremely long-living giant PPC (GPPC) in monolayer MoS2 (ML-MoS2) field-effect transistors (FET) with a time constant of ~30 days. Furthermore, this effect leads to a large enhancement of the conductivity up to a factor of 107. In contrast to previous studies in which the origin of the PPC was attributed to extrinsic reasons such as trapped charges in the substrate or adsorbates, we unambiguously show that the GPPC arises mainly from the intrinsic properties of ML-MoS2 such as lattice defects that induce a large amount of localized states in the forbidden gap. This finding is supported by a detailed experimental and theoretical study of the electric transport in TMD based FETs as well as by characterization of ML-MoS2 with scanning tunneling spectroscopy, high-resolution transmission electron microscopy, and photoluminescence measurements. The obtained results provide a basis towards the defect-based engineering of the electronic and optical properties of TMDs for device applications.

preprint2020arXiv

Quantification of the weight of fingerprint evidence using a ROC-based Approximate Bayesian Computation algorithm for model selection

For more than a century, fingerprints have been used with considerable success to identify criminals or verify the identity of individuals. The categorical conclusion scheme used by fingerprint examiners, and more generally the inference process followed by forensic scientists, have been heavily criticised in the scientific and legal literature. Instead, scholars have proposed to characterise the weight of forensic evidence using the Bayes factor as the key element of the inference process. In forensic science, quantifying the magnitude of support is equally as important as determining which model is supported. Unfortunately, the complexity of fingerprint patterns render likelihood-based inference impossible. In this paper, we use an Approximate Bayesian Computation model selection algorithm to quantify the weight of fingerprint evidence. We supplement the ABC algorithm using a Receiver Operating Characteristic curve to mitigate the effect of the curse of dimensionality. Our modified algorithm is computationally efficient and makes it easier to monitor convergence as the number of simulations increase. We use our method to quantify the weight of fingerprint evidence in forensic science, but we note that it can be applied to any other forensic pattern evidence.