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Source author record

Boyuan Huang

Boyuan Huang appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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cond-mat.mtrl-scicond-mat.mes-hallphysics.ins-det

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Published work

3 published item(s)

preprint2021arXiv

Dynamics of Polar Skyrmion Bubbles under Electric Fields

Room-temperature polar skyrmion bubbles that are recently found in oxide superlattice, have received enormous interests for their potential applications in nanoelectronics due to the nanometer size, emergent chirality, and negative capacitance. For practical applications, the ability to controllably manipulate them by using external stimuli is prerequisite. Here, we study the dynamics of individual polar skyrmion bubbles at the nanoscale by using in situ biasing in a scanning transmission electron microscope. The reversible electric field-driven phase transition between topological and trivial polar states are demonstrated. We create, erase and monitor the shrinkage and expansion of individual polar skyrmions. We find that their transition behaviors are substantially different from that of magnetic analogue. The underlying mechanism is discussed by combing with the phase-field simulations. The controllable manipulation of nanoscale polar skyrmions allows us to tune the dielectric permittivity at atomic scale and detailed knowledge of their phase transition behaviors provides fundamentals for their applications in nanoelectronics.

0 citations0 reviewsNo code linkedOpen access
preprint2018arXiv

Artificial Intelligent Atomic Force Microscope Enabled by Machine Learning

Artificial intelligence (AI) and machine learning have promised to revolutionize the way we live and work, and one of particularly promising areas for AI is image analysis. Nevertheless, many current AI applications focus on post-processing of data, while in both materials sciences and medicines, it is often critical to respond to the data acquired on the fly. Here we demonstrate an artificial intelligent atomic force microscope (AI-AFM) that is capable of not only pattern recognition and feature identification in ferroelectric materials and electrochemical systems, but can also respond to classification via adaptive experimentation with additional probing at critical domain walls and grain boundaries, all in real time on the fly without human interference. We believe such a strategy empowered by machine learning is applicable to a wide range of instrumentations and broader physical machineries.

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preprint2018arXiv

Mapping Intrinsic Electromechanical Responses at the Nanoscale via Sequential Excitation Scanning Probe Microscopy Empowered by Deep Data

Ever increasing hardware capabilities and computation powers have made acquisition and analysis of big scientific data at the nanoscale routine, though much of the data acquired often turns out to be redundant, noisy, and/or irrelevant to the problems of interests, and it remains nontrivial to draw clear mechanistic insights from pure data analytics. In this work, we use scanning probe microscopy (SPM) as an example to demonstrate deep data methodology, transitioning from brute force analytics such as data mining, correlation analysis, and unsupervised classification to informed and/or targeted causative data analytics built on sound physical understanding. Three key ingredients of such deep data analytics are presented. A sequential excitation scanning probe microscopy (SE-SPM) technique is first adopted to acquire high quality, efficient, and physically relevant data, which can be easily implemented on any standard atomic force microscope (AFM). Brute force physical analysis is then carried out using simple harmonic oscillator (SHO) model, enabling us to derive intrinsic electromechanical coupling of interests. Finally, principal component analysis (PCA) is carried out, which not only speeds up the analysis by four orders of magnitude, but also allows a clear physical interpretation of its modes in combination with SHO analysis. A rough piezoelectric material has been probed using such strategy, enabling us to map its intrinsic electromechanical properties at the nanoscale with high fidelity, where conventional methods fail. The SE in combination with deep data methodology can be easily adapted for other SPM techniques to probe a wide range of functional phenomena at the nanoscale.

0 citations0 reviewsNo code linkedOpen access