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Bingfeng Miao

Bingfeng Miao contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

Lieb lattices formed by real atoms on Ag(111) and their lattice constant dependent electronic properties

Scanning tunneling microscopy is a powerful tool to build artificial atomic structures even not exist in nature but possess exotic properties. We here constructed Lieb lattices with different lattice constants by real atoms, i.e., Fe atoms on Ag(111) and probed their electronic properties. We find a surprising long-range effective electron wavefunction overlap between Fe adatoms as it exhibits a 1/r2-dependence with the interatomic distance r instead of the theoretically predicted exponential one. Combining control experiments, tight-binding and Green's function calculations, we attribute the observed long-range overlap to be enabled by the surface state. Our findings not only enrich the understanding of the electron wavefunction overlap, but also provide a convenient platform to design and explore the artificial structures and future devices with real atoms.

preprint2022arXiv

Planar Hall effect induced spin rectification effect and its strong impact on spin pumping measurements

Spin pumping is a technique widely used to generate the pure spin current and characterize the spin-charge conversion in various systems. The reversing sign of the symmetric Lorentzian charge current with respect to opposite magnetic field is generally accepted as the key criterion to identify its pure spin current origin. However, we herein find that the rectified voltage due to the planar Hall effect can exhibit similar spurious signal, complicating and even misleading the analysis. The distribution of microwave magnetic field and induction current has strong influence on the magnetic field symmetry and lineshape of the obtained signal. We further demonstrate a geometry where the spin-charge conversion and the rectified voltage can be readily distinguished with a straightforward symmetry analysis.