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Béchir Dola

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math.ST Statistics Theory

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preprint2016arXiv

Semiparametric stationarity and fractional unit roots tests based on data-driven multidimensional increment ratio statistics

In this paper, we show that the central limit theorem (CLT) satisfied by the data-driven Multidimensional Increment Ratio (MIR) estimator of the memory parameter d established in Bardet and Dola (2012) for d $\in$ (--0.5, 0.5) can be extended to a semiparametric class of Gaussian fractionally integrated processes with memory parameter d $\in$ (--0.5, 1.25). Since the asymptotic variance of this CLT can be estimated, by data-driven MIR tests for the two cases of stationarity and non-stationarity, so two tests are constructed distinguishing the hypothesis d \textless{} 0.5 and d $\ge$ 0.5, as well as a fractional unit roots test distinguishing the case d = 1 from the case d \textless{} 1. Simulations done on numerous kinds of short-memory, long-memory and non-stationary processes, show both the high accuracy and robustness of this MIR estimator compared to those of usual semiparametric estimators. They also attest of the reasonable efficiency of MIR tests compared to other usual stationarity tests or fractional unit roots tests. Keywords: Gaussian fractionally integrated processes; semiparametric estimators of the memory parameter; test of long-memory; stationarity test; fractional unit roots test.

preprint2012arXiv

Semiparametric stationarity tests based on adaptive multidimensional increment ratio statistics

In this paper, we show that the adaptive multidimensional increment ratio estimator of the long range memory parameter defined in Bardet and Dola (2012) satisfies a central limit theorem (CLT in the sequel) for a large semiparametric class of Gaussian fractionally integrated processes with memory parameter $d \in (-0.5,1.25)$. Since the asymptotic variance of this CLT can be computed, tests of stationarity or nonstationarity distinguishing the assumptions $d<0.5$ and $d \geq 0.5$ are constructed. These tests are also consistent tests of unit root. Simulations done on a large benchmark of short memory, long memory and non stationary processes show the accuracy of the tests with respect to other usual stationarity or nonstationarity tests (LMC, V/S, ADF and PP tests). Finally, the estimator and tests are applied to log-returns of famous economic data and to their absolute value power laws.

preprint2011arXiv

Adaptive estimator of the memory parameter and goodness-of-fit test using a multidimensional increment ratio statistic

The increment ratio (IR) statistic was first defined and studied in Surgailis {\it et al.} (2007) for estimating the memory parameter either of a stationary or an increment stationary Gaussian process. Here three extensions are proposed in the case of stationary processes. Firstly, a multidimensional central limit theorem is established for a vector composed by several IR statistics. Secondly, a goodness-of-fit $χ^2$-type test can be deduced from this theorem. Finally, this theorem allows to construct adaptive versions of the estimator and test which are studied in a general semiparametric frame. The adaptive estimator of the long-memory parameter is proved to follow an oracle property. Simulations attest of the interesting accuracies and robustness of the estimator and test, even in the non Gaussian case.