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Arun Surya

Arun Surya contributes to research discovery and scholarly infrastructure.

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Published work

4 published item(s)

preprint2022arXiv

Design of an IR Imaging Channel for the Keck Observatory SCALES Instrument

A next-generation instrument named, Slicer Combined with Array of Lenslets for Exoplanet Spectroscopy (SCALES), is being planned for the W. M. Keck Observatory. SCALES will have an integral field spectrograph (IFS) and a diffraction-limited imaging channel to discover and spectrally characterize the directly imaged exoplanets. Operating at thermal infrared wavelengths (1-5 micron, and a goal of 0.6-5 micron), the imaging channel of the SCALES is designed to cover a 12"x 12" field of view with low distortions and high throughput. Apart from expanding the mid-infrared science cases and providing a potential upgrade/alternative for the NIRC2, the H2RG detector of the imaging channel can take high-resolution images of the pupil to aid the alignment process.Further, the imaging camera would also assist in small field acquisition for the IFS arm. In this work, we present the optomechanical design of the imager and evaluate its capabilities and performances.

preprint2022arXiv

Design of SCALES: A 2-5 Micron Coronagraphic Integral Field Spectrograph for Keck Observatory

We present the design of SCALES (Slicer Combined with Array of Lenslets for Exoplanet Spectroscopy) a new 2-5 micron coronagraphic integral field spectrograph under construction for Keck Observatory. SCALES enables low-resolution (R~50) spectroscopy, as well as medium-resolution (R~4,000) spectroscopy with the goal of discovering and characterizing cold exoplanets that are brightest in the thermal infrared. Additionally, SCALES has a 12x12" field-of-view imager that will be used for general adaptive optics science at Keck. We present SCALES's specifications, its science case, its overall design, and simulations of its expected performance. Additionally, we present progress on procuring, fabricating and testing long lead-time components.

preprint2022arXiv

Liger at Keck Observatory: Design of the Data Reduction System and Software Interfaces

Liger is a second generation near-infrared imager and integral field spectrograph (IFS) for the W. M. Keck Observatory that will utilize the capabilities of the Keck All-sky Precision Adaptive-optics (KAPA) system. Liger operates at a wavelength range of 0.81 μm - 2.45 μm and utilizes a slicer and a lenslet array IFS with varying spatial plate scales and fields of view resulting in hundreds of modes available to the astronomer. Because of the high level of complexity in the raw data formats for the slicer and lenslet IFS modes, Liger must be designed in conjunction with a Data Reduction System (DRS) which will reduce data from the instrument in real-time and deliver science-ready data products to the observer. The DRS will reduce raw imager and IFS frames from the readout system and provide 2D and 3D data products via custom quick-look visualization tools suited to the presentation of IFS data. The DRS will provide the reduced data to the Keck Observatory Archive (KOA) and will be available to astronomers for offline post-processing of observer data. We present an initial design for the DRS and define the interfaces between observatory and instrument software systems.

preprint2022arXiv

SCALES for Keck: Optical Design

SCALES is a high-contrast, infrared coronagraphic imager and integral field spectrograph (IFS) to be deployed behind the W.M. Keck Observatory adaptive optics system. A reflective optical design allows diffraction-limited imaging over a large wavelength range (1.0 - 5.0 microns). A microlens array-based IFS coupled with a lenslet reformatter ("slenslit") allow spectroscopy at both low (R = 35 - 250) and moderate (R = 2000 - 6500) spectral resolutions. The large wavelength range, diffraction-limited performance, high contrast coronagraphy and cryogenic operation present a unique optical design challenge. We present the full SCALES optical design, including performance modeling and analysis and manufacturing.