Researcher profile

Arman Roohi

Arman Roohi contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

PISA: A Binary-Weight Processing-In-Sensor Accelerator for Edge Image Processing

This work proposes a Processing-In-Sensor Accelerator, namely PISA, as a flexible, energy-efficient, and high-performance solution for real-time and smart image processing in AI devices. PISA intrinsically implements a coarse-grained convolution operation in Binarized-Weight Neural Networks (BWNNs) leveraging a novel compute-pixel with non-volatile weight storage at the sensor side. This remarkably reduces the power consumption of data conversion and transmission to an off-chip processor. The design is completed with a bit-wise near-sensor processing-in-DRAM computing unit to process the remaining network layers. Once the object is detected, PISA switches to typical sensing mode to capture the image for a fine-grained convolution using only the near-sensor processing unit. Our circuit-to-application co-simulation results on a BWNN acceleration demonstrate acceptable accuracy on various image datasets in coarse-grained evaluation compared to baseline BWNN models, while PISA achieves a frame rate of 1000 and efficiency of ~1.74 TOp/s/W. Lastly, PISA substantially reduces data conversion and transmission energy by ~84% compared to a baseline CPU-sensor design.

preprint2020arXiv

Entropy-Based Modeling for Estimating Soft Errors Impact on Binarized Neural Network Inference

Over past years, the easy accessibility to the large scale datasets has significantly shifted the paradigm for developing highly accurate prediction models that are driven from Neural Network (NN). These models can be potentially impacted by the radiation-induced transient faults that might lead to the gradual downgrade of the long-running expected NN inference accelerator. The crucial observation from our rigorous vulnerability assessment on the NN inference accelerator demonstrates that the weights and activation functions are unevenly susceptible to both single-event upset (SEU) and multi-bit upset (MBU), especially in the first five layers of our selected convolution neural network. In this paper, we present the relatively-accurate statistical models to delineate the impact of both undertaken SEU and MBU across layers and per each layer of the selected NN. These models can be used for evaluating the error-resiliency magnitude of NN topology before adopting them in the safety-critical applications.