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Researcher profile

Antonello De Martino

Antonello De Martino contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
physics.optics

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Published work

2 published item(s)

preprint2014arXiv

Effect of speckle on APSCI method and Mueller Imaging

The principle of the polarimetric imaging method called APSCI (Adapted Polarization State Contrast Imaging) is to maximize the polarimetric contrast between an object and its background using specific polarization states of illumination and detection. We perform here a comparative study of the APSCI method with existing Classical Mueller Imaging(CMI) associated with polar decomposition in the presence of fully and partially polarized circular Gaussian speckle. The results show a noticeable increase of the Bhattacharyya distance used as our contrast parameter for the APSCI method, especially when the object and background exhibit several polarimetric properties simultaneously.

0 citations0 reviewsNo code linkedOpen access
preprint2013arXiv

Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization

This article aims to provide a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique in that information about the physical properties of a sample is obtained through modeling analysis. Standard ellipsometry is typically used to characterize optically isotropic bulk and/or layered materials. More advanced techniques like Mueller ellipsometry, also known as polarimetry in literature, are necessary for the complete and accurate characterization of anisotropic and/or depolarizing samples which occur in many instances, both in research and "real life" activities. In this article we cover three main areas of subject: basic theory of polarization, standard ellipsometry and Mueller ellipsometry. Section I is devoted to a short and pedagogical introduction of the formalisms used to describe light polarization. The following section is devoted to standard ellipsometry. The focus is on the experimental aspects, including both pros and cons of commercially available instruments. Section III is devoted to recent advances in Mueller ellipsometry. Applications examples are provided in sections II and III to illustrate how each technique works.

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