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Andrew D. Holland

Andrew D. Holland appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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2 published item(s)

preprint2021arXiv

A Comprehensive Line-Spread Function Error Budget for the Off-Plane Grating Rocket Experiment

The Off-plane Grating Rocket Experiment (OGRE) is a soft X-ray grating spectrometer to be flown on a suborbital rocket. The payload is designed to obtain the highest-resolution soft X-ray spectrum of Capella to date with a resolution goal of $R(λ/Δλ)>2000$ at select wavelengths in its 10--55 Angstrom bandpass of interest. The optical design of the spectrometer realizes a theoretical maximum resolution of $R\approx5000$, but this performance does not consider the finite performance of the individual spectrometer components, misalignments between components, and in-flight pointing errors. These errors all degrade the performance of the spectrometer from its theoretical maximum. A comprehensive line-spread function (LSF) error budget has been constructed for the OGRE spectrometer to identify contributions to the LSF, to determine how each of these affects the LSF, and to inform performance requirements and alignment tolerances for the spectrometer. In this document, the comprehensive LSF error budget for the OGRE spectrometer is presented, the resulting errors are validated via raytrace simulations, and the implications of these results are discussed.

preprint2020arXiv

Simulations and Design of a Single-Photon CMOS Imaging Pixel Using Multiple Non-Destructive Signal Sampling

A single-photon CMOS image sensor design based on pinned photodiode (PPD) with multiple charge transfers and sampling is described. In the proposed pixel architecture, the photogenerated signal is sampled non-destructively multiple times and the results are averaged. Each signal measurement is statistically independent and by averaging the electronic readout noise is reduced to a level where single photons can be distinguished reliably. A pixel design using this method has been simulated in TCAD and several layouts have been generated for a 180 nm CMOS image sensor process. Using simulations, the noise performance of the pixel has been determined as a function of the number of samples, sense node capacitance, sampling rate, and transistor characteristics. The strengths and the limitations of the proposed design are discussed in detail, including the trade-off between noise performance and readout rate and the impact of charge transfer inefficiency. The projected performance of our first prototype device indicates that single-photon imaging is within reach and could enable ground-breaking performance in many scientific and industrial imaging applications.