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Researcher profile

Ali Akbar Darki

Ali Akbar Darki contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
physics.opticscond-mat.mes-hall

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Published work

3 published item(s)

preprint2021arXiv

Polarization-independent optical spatial differentiation with a doubly-resonant one-dimensional guided-mode grating

We report on the design and experimental characterization of a suspended silicon nitride subwavelength grating possessing a polarization-independent guided-mode resonance at oblique incidence. At this resonant wavelength we observe that the transverse intensity profile of the transmitted beam is consistent with a first-order spatial differentiation of the incident beam profile in the direction of the grating periodicity, regardless of the incident light polarization. These observations are corroborated by full numerical simulations. The simple one-dimensional and symmetric design, combined with the thinness and excellent mechanical properties of these essentially loss-free dieletric films, is attractive for applications in optical processing, sensing and optomechanics.

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preprint2020arXiv

Optical spatial differentiation with suspended subwavelength gratings

We demonstrate first- and second-order spatial differentiation of an optical beam transverse profile using thin suspended subwavelength gratings. Highly reflective one-dimensional gratings are patterned on suspended 200 nm-thick silicon nitride membranes using Electron Beam Lithography and plasma etching. The optical transmission of these gratings, designed for illumination with either TM or TE polarized light, are experimentally measured under normal and oblique incidence and found to be in excellent agreement with the predictions of an analytical coupled-mode model as well as Rigorous Coupled Wave Analysis numerical simulations. High quality first- and second-order spatial differentiation of a Gaussian beam are observed in transmission at oblique and normal incidence, respectively. Such easy-to-fabricate, ultrathin and loss-free optical components may be attractive for beam shaping and optical information processing and computing.

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preprint2020arXiv

Profilometry and stress analysis of suspended nanostructured thin films

The profile of suspended silicon nitride thin films patterned with one-dimensional subwavelength grating structures is investigated using Atomic Force Microscopy. We first show that the results of the profilometry can be used as input to Rigorous Coupled Wave Analysis simulations to predict the transmission spectrum of the gratings under illumination by monochromatic light at normal incidence and compare the results of the simulations with experiments. Secondly, we observe sharp vertical deflections of the films at the boundaries of the patterned area due to local modifications of the tensile stress during the patterning process. These deflections are experimentally observed for various grating structures and investigated on the basis of a simple analytical model as well as finite element method simulations.

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