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Researcher profile

Alexander Lind

Alexander Lind contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
Cryptography and Securityhep-phphysics.app-phphysics.optics

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Published work

3 published item(s)

preprint2022arXiv

1-GHz mid-infrared frequency comb spanning 3 to 13 μm

Mid-infrared (MIR) spectrometers are invaluable tools for molecular fingerprinting and hyper-spectral imaging. Among the available spectroscopic approaches, GHz MIR dual-comb absorption spectrometers have the potential to simultaneously combine the high-speed, high spectral resolution, and broad optical bandwidth needed to accurately study complex, transient events in chemistry, combustion, and microscopy. However, such a spectrometer has not yet been demonstrated due to the lack of GHz MIR frequency combs with broad and full spectral coverage. Here, we introduce the first broadband MIR frequency comb laser platform at 1 GHz repetition rate that achieves spectral coverage from 3 to 13 μm. This frequency comb is based on a commercially available 1.56 μm mode-locked laser, robust all-fiber Er amplifiers and intra-pulse difference frequency generation (IP-DFG) of few-cycle pulses in \c{hi}(2) nonlinear crystals. When used in a dual comb spectroscopy (DCS) configuration, this source will simultaneously enable measurements with μs time resolution, 1 GHz (0.03 cm-1) spectral point spacing and a full bandwidth of >5 THz (>166 cm-1) anywhere within the MIR atmospheric windows. This represents a unique spectroscopic resource for characterizing fast and non-repetitive events that are currently inaccessible with other sources.

0 citations0 reviewsNo code linkedOpen access
preprint2021arXiv

H1jet, a fast program to compute transverse momentum distributions

We present H1jet, a fast code that computes the total cross section and differential distribution in the transverse momentum of a colour singlet. In its current version, the program implements only leading-order $2\to 1$ and $2\to 2$ processes, but could be extended to higher orders. We discuss the processes implemented in H1jet, give detailed instructions on how to implement new processes, and perform comparisons to existing codes. This tool, mainly designed for theorists, can be fruitfully used to assess deviations of selected new physics models from the Standard Model behaviour, as well as to quickly obtain distributions of relevance for Standard Model phenomenology.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Silicon Dating

In order to service an ever-growing base of legacy electronics, both government and industry customers must turn to third-party brokers for components in short supply or discontinued by the original manufacturer. Sourcing equipment from a third party creates an opportunity for unscrupulous gray market suppliers to insert counterfeit devices: failed, knock-off, or otherwise inferior to the original product. This increases the supplier's profits at the expense of reduced performance/reliability of the customer's system. The most challenging class of counterfeit devices to detect is recycled counterfeits: recovered genuine devices which are re-sold as new. Such devices are difficult to detect because they typically pass performance and parametric tests but fail prematurely due to age-related wear. To address the challenge of detecting recycled devices pre-deployment, we develop Silicon Dating: a low-overhead classifier for detecting recycled integrated circuits using Static Random-Access Memory (SRAM) power-on states. Silicon Dating targets devices with no known-new record or purpose-built anti-recycling hardware. We observe that over time, software running on a device imprints its unique data patterns into SRAM through analog-domain changes; we measure the level and direction of this change through SRAM power-on state statistics. In contrast to highly symmetric power-on states produced by variation during SRAM fabrication, we show that embedded software data is generally highly asymmetric and that the degree of power-on state asymmetry imprinted by software reveals device use. Using empirical results from embedded benchmarks running on several microcontrollers, we show that Silicon Dating identifies recycled devices with 84.1% accuracy with no software-specific knowledge and with 92.0% accuracy by incorporating software knowledge---without prior device enrollment or modification.

0 citations0 reviewsNo code linkedOpen access