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Alessandro Cultrera

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cond-mat.mes-hall cond-mat.mtrl-sci physics.app-ph physics.ins-det

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preprint2020arXiv

Good Practice Guide on the electrical characterisation of graphene using contact methods

This guide is a deliverable of the Joint Research Project 16NRM01 GRACE -- Developing electrical characterisation methods for future graphene electronics. The project belongs to the European Metrology Programme for Innovation and Research (EMPIR). GRACE is framed within the Normative targeted program, and its overall goal is (1) the development of validated protocols for the measurement of the electrical properties of graphene, and their implementation in order to achieve accurate and fastthroughput measurement of graphene; and (2) the collaboration with international standardisation committees in order to initiate and develop dedicated documentary standards for the electrical characterisation of graphene. The adoption of this GPGs and, when published, the corresponding standards, will allow industry to perform accurate measurements of the electrical properties of graphene and thereby provide customers with reliable and comparable specifications of graphene as an industrial product.

preprint2020arXiv

Good Practice Guide on the electrical characterization of graphene using non-contact and high-throughput methods

The electrical characterisation of graphene, either in plane sheets or in properly geometrised form can be approached using non-contact methods already employed for thin film materials. The extraordinary thinness (and, correspondingly, the volume) of graphene, however, makes the proper application of these methods difficult. The electrical properties of interest (sheet electrical resistivity/conductivity, concentration and mobility of charge carriers) must be indirectly derived from the measurement outcome by geometrical and electrical modelling; the assumptions behind such models (e.g., uniformity and isotropy, effective value of the applied fields, etc.) require careful consideration. The traceability of the measurement to the International System of units and a proper expression of measurement uncertainty is an issue. This guide focuses on non-contact and high-throughput methods, that are methods where the graphene sample surface is not physically contacted with any metallic electrodes at any stage. A companion guide about contact methods is also available. The methods discussed are: - Measurement of surface potential and work function using Scanning Kelvin Probe Microscopy (SKPM); - Measurement of sheet resistance by Microwave Resonant Cavity; - Measurement of sheet resistance by Terahertz time-domain spectroscopy (THz-TDS); For each method, a corresponding measurement protocol is discussed, which describes: - The measurement principle; - Sample requirements and preparation; - A description of the measurement equipment / apparatus; - Calibration standards and ways to achieve a traceable measurement;

preprint2016arXiv

Electrical Resistance Tomography of Conductive Thin Films

The Electrical Resistance Tomography (ERT) technique is applied to the measurement of sheet conductance maps of both uniform and patterned conductive thin films. Images of the sheet conductance spatial distribution, and local conductivity values are obtained. Test samples are tin oxide films on glass substrates, with electrical contacts on the sample boundary, some samples are deliberately patterned in order to induce null conductivity zones of known geometry while others contain higher conductivity inclusions. Four-terminal resistance measurements among the contacts are performed with a scanning setup. The ERT reconstruction is performed by a numerical algorithm based on the total variation regularization and the L-curve method. ERT correctly images the sheet conductance spatial distribution of the samples. The reconstructed conductance values are in good quantitative agreement with independent measurements performed with the van der Pauw and the four-point probe methods.