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Researcher profile

Adrian Cristal

Adrian Cristal contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
eess.SPHardware ArchitectureMachine LearningNeural and Evolutionary Computing

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Published work

2 published item(s)

preprint2020arXiv

Power and Accuracy of Multi-Layer Perceptrons (MLPs) under Reduced-voltage FPGA BRAMs Operation

In this paper, we exploit the aggressive supply voltage underscaling technique in Block RAMs (BRAMs) of Field Programmable Gate Arrays (FPGAs) to improve the energy efficiency of Multi-Layer Perceptrons (MLPs). Additionally, we evaluate and improve the resilience of this accelerator. Through experiments on several representative FPGA fabrics, we observe that until a minimum safe voltage level, i.e., Vmin the MLP accuracy is not affected. This safe region involves a large voltage guardband. Also, it involves a narrower voltage region where faults start to appear in memories due to the increased circuit delay, but these faults are masked by MLP, and thus, its accuracy is not affected. However, further undervolting causes significant accuracy loss as a result of the fast-increasing high fault rates. Based on the characterization of these undervolting faults, we propose fault mitigation techniques that can effectively improve the resilience behavior of such accelerator. Our evaluation is based on four FPGA platforms. On average, we achieve >90% energy saving with a negligible accuracy loss of up to 0.1%.

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preprint2019arXiv

On the Resilience of Deep Learning for Reduced-voltage FPGAs

Deep Neural Networks (DNNs) are inherently computation-intensive and also power-hungry. Hardware accelerators such as Field Programmable Gate Arrays (FPGAs) are a promising solution that can satisfy these requirements for both embedded and High-Performance Computing (HPC) systems. In FPGAs, as well as CPUs and GPUs, aggressive voltage scaling below the nominal level is an effective technique for power dissipation minimization. Unfortunately, bit-flip faults start to appear as the voltage is scaled down closer to the transistor threshold due to timing issues, thus creating a resilience issue. This paper experimentally evaluates the resilience of the training phase of DNNs in the presence of voltage underscaling related faults of FPGAs, especially in on-chip memories. Toward this goal, we have experimentally evaluated the resilience of LeNet-5 and also a specially designed network for CIFAR-10 dataset with different activation functions of Rectified Linear Unit (Relu) and Hyperbolic Tangent (Tanh). We have found that modern FPGAs are robust enough in extremely low-voltage levels and that low-voltage related faults can be automatically masked within the training iterations, so there is no need for costly software- or hardware-oriented fault mitigation techniques like ECC. Approximately 10% more training iterations are needed to fill the gap in the accuracy. This observation is the result of the relatively low rate of undervolting faults, i.e., <0.1\%, measured on real FPGA fabrics. We have also increased the fault rate significantly for the LeNet-5 network by randomly generated fault injection campaigns and observed that the training accuracy starts to degrade. When the fault rate increases, the network with Tanh activation function outperforms the one with Relu in terms of accuracy, e.g., when the fault rate is 30% the accuracy difference is 4.92%.

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