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Adnan Rashid

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Published work

4 published item(s)

preprint2022arXiv

On the Formalization of the Heat Conduction Problem in HOL

Partial Differential Equations (PDEs) are widely used for modeling the physical phenomena and analyzing the dynamical behavior of many engineering and physical systems. The heat equation is one of the most well-known PDEs that captures the temperature distribution and diffusion of heat within a body. Due to the wider utility of these equations in various safety-critical applications, such as thermal protection systems, a formal analysis of the heat transfer is of utmost importance. In this paper, we propose to use higher-order-logic (HOL) theorem proving for formally analyzing the heat conduction problem in rectangular coordinates. In particular, we formally model the heat transfer as a one-dimensional heat equation for a rectangular slab using the multivariable calculus theories of the HOL Light theorem prover. This requires the formalization of the heat operator and formal verification of its various properties, such as linearity and scaling. Moreover, we use the separation of variables method for formally verifying the solution of the PDEs, which allows modeling the heat transfer in the slab under various initial and boundary conditions using HOL Light.

preprint2020arXiv

FASiM: A Framework for Automatic Formal Analysis of Simulink Models of Linear Analog Circuits

Simulink is a graphical environment that is widely adapted for the modeling and the Laplace transform based analysis of linear analog circuits used in signal processing architectures. However, due to the involvement of the numerical algorithms of MATLAB in the analysis process, the analysis results cannot be termed as complete and accurate. Higher-order-logic theorem proving is a formal verification method that has been recently proposed to overcome these limitations for the modeling and the Laplace transform based analysis of linear analog circuits. However, the formal modeling of a system is not a straightforward task due to the lack of formal methods background for engineers working in the industry. Moreover, due to the undecidable nature of higher-order logic, the analysis generally requires a significant amount of user guidance in the manual proof process. In order to facilitate industrial engineers to formally analyze the linear analog circuits based on the Laplace transform, we propose a framework, FASiM, which allows automatically conducting the formal analysis of the Simulink models of linear analog circuits using the HOL Light theorem prover. For illustration, we use FASiM to formally analyze Simulink models of some commonly used linear analog filters, such as Sallen-key filters.

preprint2020arXiv

Formal Verification of Cyber-Physical Systems using Theorem Proving (Invited Paper)

Due to major breakthroughs in software and engineering technologies, embedded systems are increasingly being utilized in areas ranging from aerospace and next-generation transportation systems, to smart grid and smart cities, to health care systems, and broadly speaking to what is known as Cyber-Physical Systems (CPS). A CPS is primarily composed of several electronic, communication and controller modules and some actuators and sensors. The mix of heterogeneous underlying smart technologies poses a number of technical challenges to the design and more severely to the verification of such complex infrastructure. In fact, a CPS shall adhere to strict safety, reliability, performance and security requirements, where one needs to capture both physical and random aspects of the various CPS modules and then analyze their interrelationship across interlinked continuous and discrete dynamics. Often times however, system bugs remain uncaught during the analysis and in turn cause unwanted scenarios that may have serious consequences in safety-critical applications. In this paper, we introduce some of the challenges surrounding the design and verification of contemporary CPS with the advent of smart technologies. In particular, we survey recent developments in the use of theorem proving, a formal method, for the modeling, analysis and verification of CPS, and overview some real world CPS case studies from the automotive, avionics and healthtech domains from system level to physical components.

preprint2016arXiv

Reproducibility of Retinal Thickness Measurements across Spectral-Domain Optical Coherence Tomography Devices using Iowa Reference Algorithm

PURPOSE: Establishing and obtaining consistent quantitative indices of retinal thickness from a variety of clinically used Spectral-Domain Optical Coherence Tomography scanners. DESIGN: Retinal images from five Spectral-Domain Optical Coherence Tomography scanners were used to determine total retinal thickness with scanner-specific correction factors establishing consistency of thickness measurement across devices. PARTICIPANTS: 55 Fovea-centered Spectral-Domain Optical Coherence Tomography volumes from eleven subjects were analyzed, obtained from Cirrus HD-OCT, RS-3000, Heidelberg Spectralis, RTVue and Topcon2000, seven subjects with retinal diseases and four normal controls. METHOD: The Iowa Reference Algorithm measured total retinal thickness. Nonlinear model of total retinal thickness measurement comparisons was derived and used for device-specific comparisons. Bland-Altman plots and pairwise predictive equations yielded pairwise scanner-specific differences. Mendel test determined whether measurement biases were constant for each scanner pair. RESULTS: Mendel test revealed that all pairwise scanner differences of total retinal thickness were constant across the cohort (p=0.992). Individual measurements can thus be bias-corrected and the Iowa Reference Algorithm serve as a scanner-agnostic independent standard of total retinal thickness across the five tested SD-OCT scanners. CONCLUSIONS: Combination of the Iowa Reference Algorithm with scanner-specific bias correction yields cross-scanner consistency of total retinal thickness measurements, facilitating scanning-device independent quantitative assessment of total retinal thickness, longitudinal follow-up quantification without requiring patients to be imaged on the same scanner model, and allowing for multi-center studies with heterogeneous device utilization when using the Iowa Reference Algorithm.