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Aadil Oufkir

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2 publications

preprint2026arXiv

Improved Lower Bounds for Learning Quantum Channels in Diamond Distance

We prove that learning an unknown quantum channel with input dimension dAd_A, output dimension dBd_B, and Choi rank rr to diamond distance ε\varepsilon requires Ω ⁣(dAdBrεlog⁡(dBr/ε)) Ω\!\left( \frac{d_A d_B r}{\varepsilon \log(d_B r / \varepsilon)} \right) channel queries when dA=rdBd_A= rd_B, and Ω ⁣(dAdBrε2log⁡(dBr/ε))Ω\!\left( \frac{d_A d_B r}{\varepsilon^2 \log(d_B r / \varepsilon)} \right) channel queries when dA≤rdB/2d_A\le rd_B/2. These lower bounds improve upon the best previous Ω(dAdBr)Ω(d_A d_B r) bound by introducing explicit, near-optimal ε\varepsilon-dependence. Moreover, when dA≤rdB/2d_A\le rd_B/2, the lower bound is optimal up to a logarithmic factor. The proof constructs ensembles of channels that are well separated in diamond norm yet admit Stinespring isometries that are close in operator norm.

preprint2022arXiv

Sequential algorithms for testing identity and closeness of distributions

What advantage do \emph{sequential} procedures provide over batch algorithms for testing properties of unknown distributions? Focusing on the problem of testing whether two distributions D1\mathcal{D}_1 and D2\mathcal{D}_2 on {1,…,n}\{1,\dots, n\} are equal or εε-far, we give several answers to this question. We show that for a small alphabet size nn, there is a sequential algorithm that outperforms any batch algorithm by a factor of at least 44 in terms sample complexity. For a general alphabet size nn, we give a sequential algorithm that uses no more samples than its batch counterpart, and possibly fewer if the actual distance TV(D1,D2)TV(\mathcal{D}_1, \mathcal{D}_2) between D1\mathcal{D}_1 and D2\mathcal{D}_2 is larger than εε. As a corollary, letting εε go to 00, we obtain a sequential algorithm for testing closeness when no a priori bound on TV(D1,D2)TV(\mathcal{D}_1, \mathcal{D}_2) is given that has a sample complexity O~(n2/3TV(D1,D2)4/3)\tilde{\mathcal{O}}(\frac{n^{2/3}}{TV(\mathcal{D}_1, \mathcal{D}_2)^{4/3}}): this improves over the O~(n/log⁡nTV(D1,D2)2)\tilde{\mathcal{O}}(\frac{n/\log n}{TV(\mathcal{D}_1, \mathcal{D}_2)^{2} }) tester of \cite{daskalakis2017optimal} and is optimal up to multiplicative constants. We also establish limitations of sequential algorithms for the problem of testing identity and closeness: they can improve the worst case number of samples by at most a constant factor.

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