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Researcher profile

A. Mirone

A. Mirone contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.str-elastro-ph.IMcond-mat.mtrl-sci

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Published work

5 published item(s)

preprint2015arXiv

Characterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM results

Future hard (10 -100 keV) X-ray telescopes (SIMBOL-X, Con-X, HEXIT-SAT, XEUS) will implement focusing optics with multilayer coatings: in view of the production of these optics we are exploring several deposition techniques for the reflective coatings. In order to evaluate the achievable optical performance X-Ray Reflectivity (XRR) measurements are performed, which are powerful tools for the in-depth characterization of multilayer properties (roughness, thickness and density distribution). An exact extraction of the stack parameters is however difficult because the XRR scans depend on them in a complex way. The PPM code, developed at ERSF in the past years, is able to derive the layer-by-layer properties of multilayer structures from semi-automatic XRR scan fittings by means of a global minimization procedure in the parameters space. In this work we will present the PPM modeling of some multilayer stacks (Pt/C and Ni/C) deposited by simple e-beam evaporation. Moreover, in order to verify the predictions of PPM, the obtained results are compared with TEM profiles taken on the same set of samples. As we will show, PPM results are in good agreement with the TEM findings. In addition, we show that the accurate fitting returns a physically correct evaluation of the variation of layers thickness through the stack, whereas the thickness trend derived from TEM profiles can be altered by the superposition of roughness profiles in the sample image.

0 citations0 reviewsNo code linkedOpen access
preprint2011arXiv

Probing photo-induced melting of antiferromagnetic order in La0.5Sr1.5MnO4 by ultrafast resonant soft X-ray diffraction

Photo-excitation in complex oxides1 transfers charge across semicovalent bonds, drastically perturbing spin and orbital orders2. Light may then be used in compounds like magnetoresistive manganites to control magnetism on nanometre lengthscales and ultrafast timescales. Here, we show how ultrafast resonant soft x-ray diffraction can separately probe the photo-induced dynamics of spin and orbital orders in La0.5Sr1.5MnO4. Ultrafast melting of CE antiferromagnetic spin order is evidenced by the disappearance of a (1/4,1/4,1/2) diffraction peak. On the other hand the (1/4,1/4,0) peak, reflecting orbital order, is only partially reduced. Cluster calculations aid our interpretation by considering different magnetically ordered states accessible after photo-excitation. Nonthermal coupling between light and magnetism emerges as a primary aspect of photo-induced phase transitions in manganites.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Doping and temperature dependence of Mn 3d states in A-site ordered manganites

We present a systematic study of the electronic structure in A-site ordered manganites as function of doping and temperature. The energy dependencies observed with soft x-ray resonant diffraction (SXRD) at the Mn L_{2,3} edges are compared with structural investigations using neutron powder diffraction as well as with cluster calculations. The crystal structures obtained with neutron powder diffraction reflect the various orbital and charge ordered phases and show an increase of the Mn-O-Mn bond angle as function of doping and temperature. Cluster calculations show that the observed spectral changes in SXRD as a function of doping are more pronounced than expected from an increase in bandwitdh due to the increase in Mn-O-Mn bond angle, and are best described by holes that are distributed at the neighbouring oxygen ions. These holes are not directly added to the Mn 3d shell, but centered at the Mn site. In contrast, the spectral changes in SXRD as function of temperature are best described by an increase of magnetic correlations. This demonstrates the strong correlations between orbitals and magnetic moments of the 3d states.

0 citations0 reviewsNo code linkedOpen access
preprint2009arXiv

A hard X- ray probe to study doping-dependent electron redistribution and strong covalency in La_{1-x}Sr_{1+x}MnO_4

The effect of doping on the electronic structure at the Mn sites in the La_{1-x}Sr_{1+x}MnO_4 series (x=0, 0.3 and 0.5) was studied by means of non-resonant hard X- ray emission spectroscopy (XES). We observe a linear dichroism in the Mn K-beta main lines (3p to 1s transitions) that is strongest for x=0 and decreases with increasing x to 0.5. The Mn K-beta main lines in the poly-crystalline samples change considerably less upon increasing the hole doping (substitution of La by Sr) than it would be expected based on the change of formal valence. From this we conclude that the charge and spin density at the Mn sites are only little affected by doping. This implies that holes injected in the La_{1-x}Sr_{1+x}MnO_4 series mainly result in a decrease of charge density on the oxygen atoms, i.e. oxygen takes part in the charge balancing. These findings are supported by many-body cluster calculations.

0 citations0 reviewsNo code linkedOpen access
preprint2009arXiv

Measuring magnetic profiles at manganite surfaces with monolayer resolution

The performance of manganite-based magnetic tunnel junctions (MTJs) has suffered from reduced magnetization present at the junction interfaces that is ultimately responsible for the spin polarization of injected currents; this behavior has been attributed to a magnetic "dead layer" that typically extends a few unit cells into the manganite. X-ray magnetic scattering in resonant conditions (XRMS) is one of the most innovative and effective techniques to extract surface or interfacial magnetization profiles with subnanometer resolution, and has only recently been applied to oxide heterostructures. Here we present our approach to characterizing the surface and interfacial magnetization of such heterostructures using the XRMS technique, conducted at the BEAR beamline (Elettra synchrotron, Trieste). Measurements were carried out in specular reflectivity geometry, switching the left/right elliptical polarization of light as well the magnetization direction in the scattering plane. Spectra were collected across the Mn L2,3 edge for at least four different grazing angles in order to better analyse the interference phenomena. The resulting reflectivity spectra have been carefully fit to obtain the magnetization profiles, minimizing the number of free parameters as much as possible. Optical constants of the samples (real and imaginary part of the refractive index) in the interested frequency range are obtained through absorption measurements in two magnetization states and subsequent Kramers-Kronig transformation, allowing quantitative fits of the magnetization profile at different temperatures. We apply this method to the study of air-exposed surfaces of epitaxial La2/3Sr1/3MnO3 (001) films grown on SrTiO3 (001) substrates.

0 citations0 reviewsNo code linkedOpen access