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A. Maurel

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2 published item(s)

preprint2021arXiv

Characterization of resistive Micromegas detectors for the upgrade of the T2K Near Detector Time Projection Chambers

The second phase of the T2K experiment is expected to start data taking in autumn 2022. An upgrade of the Near Detector (ND280) is under development and includes the construction of two new Time Projection Chambers called High-Angle TPC (HA-TPC). The two endplates of these TPCs will be paved with eight Micromegas type charge readout modules. The Micromegas detector charge amplification structure uses a resistive anode to spread the charges over several pads to improve the space point resolution. This innovative technique is combined with the bulk-Micromegas technology to compose the "Encapsulated Resistive Anode Micromegas" detector. A prototype has been designed, built and exposed to an electron beam at the DESY II test beam facility. The data have been used to characterize the charge spreading and to produce a RC map. Spatial resolution better than 600 $μ$m and energy resolution better than 9% are obtained for all incident angles. These performances fulfil the requirements for the upgrade of the ND280 TPC.

preprint2010arXiv

Fast and Global Measurement of Free Surface Deformations

In this fluid dynamics video, we present an overview of the most important results recently obtained in our group using an optical profilometric technique that allows for single-shot global measurement of free-surface deformations. This system consists of a high-resolution system composed of a videoprojector and a digital camera. A fringe pattern of known characteristics is projected onto the free surface and its image is registered by the camera. The deformed fringe pattern arising from the surface deformations is later compared to the undeformed (reference) one, leading to a phase map from which the free surface can be reconstructed. Two examples are developed: (a) the study of water wave trapped modes and (b) the impact of a drop onto a thin layer of the same liquid.