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A. M. Meier

A. M. Meier contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2012arXiv

Randomized Benchmarking of Multi-Qubit Gates

As experimental platforms for quantum information processing continue to mature, characterization of the quality of unitary gates that can be applied to their quantum bits (qubits) becomes essential. Eventually, the quality must be sufficiently high to support arbitrarily long quantum computations. Randomized benchmarking already provides a platform-independent method for assessing the quality of one-qubit rotations. Here we describe an extension of this method to multi-qubit gates. We provide a platform-independent protocol for evaluating the performance of experimental Clifford unitaries, which form the basis of fault-tolerant quantum computing. We implemented the benchmarking protocol with trapped-ion two-qubit phase gates and one-qubit gates and found an error per random two-qubit Clifford unitary of $0.162 \pm 0.008$, thus setting the first benchmark for such unitaries. By implementing a second set of sequences with an extra two-qubit phase gate at each step, we extracted an error per phase gate of $0.069 \pm 0.017$. We conducted these experiments with movable, sympathetically cooled ions in a multi-zone Paul trap - a system that can in principle be scaled to larger numbers of ions.

preprint2012arXiv

Single-qubit-gate error below 10^-4 in a trapped ion

With a 9Be+ trapped-ion hyperfine-states qubit, we demonstrate an error probability per randomized single-qubit gate of 2.0(2) x 10^-5, below the threshold estimate of 10^-4 commonly considered sufficient for fault-tolerant quantum computing. The 9Be+ ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.