Source author record

A. Lounis

A. Lounis appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

2works
1topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2022arXiv

Developing an accurate and robust tool for pixel module characterization

For operation at the High Luminosity Large Hadron Collider (LHC), the ATLAS experiment is building a new all-silicon inner tracker (ITk). The production and testing of thousands of silicon pixel and strip modules is required to cover the estimated 180 m$^{2}$ of the total surface area. A compact, affordable and robust module characterization system is required for in-situ testing prior any test beam campaign or installation. A test bench setup based on an infrared laser was developed at IJCLab, allowing also for the use of micro-metric precision scanning with a radioactive source. A detailed schema of the setup, operating principles and testing methods are described in this paper, together with the first results obtained with a FE-I4 silicon pixel module.

preprint2015arXiv

Measurements and TCAD simulation of novel ATLAS planar pixel detector structures for the HL-LHC upgrade

The LHC accelerator complex will be upgraded between 2020-2022, to the High-Luminosity-LHC, to considerably increase statistics for the various physics analyses. To operate under these challenging new conditions, and maintain excellent performance in track reconstruction and vertex location, the ATLAS pixel detector must be substantially upgraded and a full replacement is expected. Processing techniques for novel pixel designs are optimised through characterisation of test structures in a clean room and also through simulations with Technology Computer Aided Design (TCAD). A method to study non-perpendicular tracks through a pixel device is discussed. Comparison of TCAD simulations with Secondary Ion Mass Spectrometry (SIMS) measurements to investigate the doping profile of structures and validate the simulation process is also presented.