Phonon scattering in quasicrystalline i-Al_{72}Pd_{19.5}Mn_{8.5}: A study of the low-temperature thermal conductivity
We measured the thermal conductivity of an icosahedral quasicrystal i-Al_{72}Pd_{19.5}Mn_{8.5} in the temperature range between 0.4 K and 300 K. The analysis of the low-temperature results was based on a Debye-type model. The results of the analysis for the two temperature regions of 0.4 K <T<40 K and 0.4 K <T<1 K, are not consistent in the sense that a tunnelling-states contribution to phonon scattering is verified only for 0.4 K <T<1 K. The same fitting procedure indicates that structural defects of the stacking-fault type are an important source of phonon scattering. Their physical presence was cleary identified by a transmission electron microscopy experiment.