Paper detail

Versatile Domain Mapping Of Scanning Electron Nanobeam Diffraction Datasets Utilising Variational AutoEncoders and Decoder-Assisted Latent-Space Clustering

Advancements in fast electron detectors have enabled the statistically significant sampling of crystal structures on the nanometre scale by means of Scanning Electron Nanobeam Diffraction (SEND). Characterisation of structural similarity across this length scale is key to bridging the gap between local atomic structure (using atomic resolution techniques such as High Resolution Scanning Transmission Electron Microscopy (HR-STEM)) and the macro-scale (using bulk techniques such as powder X-ray and neutron diffraction). The use of SEND technique allows for structural investigation of a broad range of samples, due to the techniques ability to operate with low electron dosage and its tolerance for sample thickness, relative to HR-STEM. This, coupled with the capacity for data collection over a wide areas and the automation of this collection, allows for statistically representative sampling of the microstructure. Also due to these factors, SEND generates large datasets and as a result automated/ semi-automated data processing workflows are required to aid in maximal extraction of useful information. As such, this paper outlines a versatile, data-driven approach for producing domain maps, as well as a statistical approach for assessing their applicability. The production of such domain maps for a dataset can help highlight nuance in the microstructure, as well as improve the manageability of that dataset for further investigation. The workflow outlined utilises a Variational AutoEncoder to identify and learn the sources of variance in the diffraction signal and this, in combination with clustering techniques, is used to produce domain maps for a set of varied example cases. This approach: is agnostic to domain crystallinity; requires no prior knowledge of crystal structure; and does not require the, potentially prohibitive, simulation of a library of appropriate diffraction patterns.