Paper detail

Using photoelectron spectroscopy to measure resonant inelastic X-ray scattering: A computational investigation

Resonant inelastic X-ray scattering (RIXS) has become an important scientific tool. Nonetheless, conventional high-resolution RIXS measurements (<100 meV), especially in the soft x-ray range, require large and low-throughput grating spectrometers that limits measurement accuracy and simplicity. Here, we computationally investigate the performance of a different method for measuring RIXS, Photoelectron Spectrometry for Analysis of X-rays (PAX). This method transforms the X-ray measurement problem of RIXS to an electron measurement problem, enabling use of compact, high-throughput electron spectrometers. In PAX, X-rays to be measured are incident on a converter material and the energy distribution of the resultant photoelectrons, the PAX spectrum, is measured with an electron spectrometer. The incident X-ray spectrum is then estimated through a deconvolution algorithm that leverages concepts from machine learning. We investigate a few example PAX cases. Using the 3d levels of Ag as a converter material, and with 10$^5$ detected electrons, we accurately estimate features with 100s of meV width in a model RIXS spectrum. Using a sharp Fermi edge to encode RIXS spectra, we accurately distinguish 100 meV FWHM peaks separated by 45 meV with 10$^7$ electrons detected that were photoemitted from within 0.4 eV of the Fermi level.