Abstract
Several theories exist to explain persistence, most of which revolve around the distribution of traps. We aim to simulate persistence and illustrate this complex issue with a 3D trap map. For this experiment, we vary the detector voltage bias to simulate the change in the depletion region that occurs when the detector is exposed to light. This allows us to measure the distribution of traps in the depletion region. This paper will explore the results from this experiment and discuss the implications.
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