Paper detail

The electronic structure formation of CuxTiSe2 in a wide range (0.04 < x < 0.8) of copper concentration

An experimental study of the electronic structure of copper intercalated titanium dichalcogenides in a wide range of copper concentrations (x = 0.05 - 0.6) using the x-rays photoemission spectroscopy, resonant photoemission and x-rays absorption spectroscopy has been performed. Negative energy shifts of the Ti 2p and Se 3d core levels spectra and a corresponding decrease of the photon energy in Ti 2p absorption spectra with increasing concentration of copper have been found. Such sign-anomalous shifts may be explained by the shielding effect of the corresponding atomic shells as a result of the dynamic charge transfer during the formation of a covalent chemical bond between the copper atoms and the TiSe2 matrix.