Paper detail

The "ideal" tearing mode: theory and resistive MHD simulations

Classical MHD reconnection theories, both the stationary Sweet-Parker model and the tearing instability, are known to provide rates which are too slow to explain the observations. However, a recent analysis has shown that there exists a critical threshold on current sheet's thickness, namely a/L~S^(-1/3), beyond which the tearing modes evolve on fast macroscopic Alfvenic timescales, provided the Lunquist number S is high enough, as invariably found in solar and astrophysical plasmas. Therefore, the classical Sweet-Parker scenario, for which the diffusive region scales as a/L~S^(-1/2) and thus can be up to ~100 times thinner than the critical value, is likely to be never realized in nature, as the current sheet itself disrupts in the elongation process. We present here two-dimensional, compressible, resistive MHD simulations, with S ranging from 10^5 to 10^7, that fully confirm the linear analysis. Moreover, we show that a secondary plasmoid instability always occurs when the same critical scaling is reached on the local, smaller scale, leading to a cascading explosive process, reminiscent of the flaring activity.