Abstract

Fabrication processes involving anhydrous hydrofluoric vapor etching are developed to create high-QQ aluminum superconducting microwave resonators on free-standing silicon membranes formed from a silicon-on-insulator wafer. Using this fabrication process, a high-impedance 8.98.9GHz coil resonator is coupled capacitively with large participation ratio to a 9.79.7MHz micromechanical resonator. Two-tone microwave spectroscopy and radiation pressure back-action are used to characterize the coupled system in a dilution refrigerator down to temperatures of Tf=11T_f = 11~mK, yielding a measured electromechanical vacuum coupling rate of g0/2π≈24.6g_{0}/2π\approx 24.6~Hz and a mechanical resonator QQ-factor of Qm=1.7×107Q_{m}=1.7\times 10^7. Microwave back-action cooling of the mechanical resonator is also studied, with a minimum phonon occupancy of nm≈16n_{m} \approx 16 phonons being realized at an elevated fridge temperature of Tf=211T_f = 211~mK.

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