Single Quasiparticle Trapping in Aluminum Nanobridge Josephson Junctions

preprint2013arXivOpen access

Abstract

We present microwave measurements of a high quality factor superconducting resonator incorporating two aluminum nanobridge Josephson junctions in a loop shunted by an on-chip capacitor. Trapped quasiparticles (QPs) shift the resonant frequency, allowing us to probe the trapped QP number and energy distribution and to quantify their lifetimes. We find that the trapped QP population obeys a Gibbs distribution above 75 mK, with non-Poissonian trapping statistics. Our results are in quantitative agreement with the Andreev bound state model of transport, and demonstrate a practical means to quantify on-chip QP populations and validate mitigation strategies in a cryogenic environment.

Explore this paper’s authors, topics and related work.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Reviews 0

Write a reviewWrite

No reviews yet.

Discussion 0

Add a commentWrite

No comments yet.