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Relaxation of Cs atomic polarization at surface coatings characterized by X-ray photoelectron spectroscopy

Paraffin coatings on glass slides were investigated through both X-ray photoelectron spectroscopy (XPS) and spin relaxation measurement for cesium (Cs) vapor. The components of the glass substrate, such as silicon (Si) and oxygen (O), existed in the XPS spectra of the coated slides, indicating the imperfection of the prepared paraffin coatings. The substrate was not observed after the annealing of the coatings in Cs vapor, which is known as a `ripening' process for spin relaxation measurement. We found a general trend that effective anti-spin relaxation performance requires high paraffin and low Cs coverage on the surface. We also examined a type of diamond-like carbon (DLC) film, anticipating the effect of anti-spin relaxation; our attempts have failed to date.