Abstract
The initial demonstrations over the last several years of the use of optical diffraction radiation (ODR) as non-intercepting electron-beam-parameter monitors are reviewed. Developments in both far-field imaging and near-field imaging are addressed for ODR generated by a metal plane with a slit aperture, a single metal plane, and two-plane interferences. Polarization effects and sensitivities to beam size, divergence, and position will be discussed as well as a proposed path towards monitoring 10-micron beam sizes at 25 GeV.
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