Abstract
We discuss the effects of a gauge freedom in representing quantum information processing devices, and its implications for characterizing these devices. We demonstrate with experimentally relevant examples that there exists equally valid descriptions of the same experiment which distribute errors differently among objects in a gate-set, leading to different error rates. Consequently, it can be misleading to attach a concrete operational meaning to figures of merit for individual gate-set elements. We propose an alternative operational figure of merit for a gate-set, the mean variation error, and a protocol for measuring this figure.
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