Abstract
Reverse and stable bipolar resistive switching effect was observed in planar NdCeCuO - NdCeO - Ag heterostructures. It was shown that the current voltage charactereriscs of the BRSE observed has a diode character. Simulations were used to consider the influence of the nonuniform distribution of an electric field at the interface of a heterojunction on the effect of bipolar resistive switching in investigated structures. The inhomogeneous distribution of the electric field near the contact edge creates regions of higher electric field strength which, in turn, stimulates motion and redistribution of defects, changes of the resistive properties of the whole structure and formation of a percolation channel.
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