Abstract
A systematic field-emission study has been carried out on different types of two-dimensional carbons in ultrahigh vacuum with the cathode-anode distance ranging from near-contact to about 124 nm. An analytical model has been developed to explain the increase of field enhancement factor with the cathode-anode distance. Good agreement has been achieved between the calculation results and experimental data, including those reported in literature. The work provides useful insights into the characteristics of field emission from two-dimensional carbon.
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