Abstract
The pyramid-to-dome transition in GeSi on Si(100) initiated by step bunching on pyramidal quantum dots is atomistically simulated using a novel multi-state lattice model incorporating effective surface reconstructions. Results are explained by a simple theory based on a shallow island approximation. Under given deposition conditions in dimensions, the shape transition is shown to occur at island size following independent of temperature and deposition rate, where $ζ\alt 2$ and is the actual Ge concentration in the island. The transition has an energy barrier dominated by the facet interface energy. Fast deposition however can out-run and delay the transition to larger island sizes.
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