Abstract

Iso-electric point(IEP) is the PH, at which the ζζ potential is measured to be zero. The occurrence of IEP has been understood due to the neutralization of surface charge density (SCD) at the solid-liquid interface. In this work, we use the potential trap model to study the sources of the surface charge density at verious PC and PH, by taking the water-silica system as an example. It is revealed that in the case of PH<8PH<8, the SCD is mainly originated from the dissociation of water molecules. And the bulk ions trapped at the interface can dominate the SCD when PH>9PH>9. Due to the mass action law, the dissociation of water molecules is suppressed at the PH close to IEP, leading to a zero surface charge density. In this way, zero ζζ potential is obtained at the IEP. It has also been obtained that the increase of the salt concentration in the water can decrease the ζζ potential, but increase the surface charge density.

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