Abstract
An innovative image analysis technique is proposed to process real solar cell pictures, identify grains and grain boundaries in polycrystalline Silicon, and finally generate finite element meshes. Using a modified intrinsic cohesive zone model approach to avoid mesh dependency, nonlinear finite element simulations show how grain boundaries and Silicon bulk properties influence the crack pattern. Numerical results demonstrate a prevalence of transgranular over intergranular cracking for similar interface fracture properties of grains and grain boundaries, in general agreement with the experimental observation.
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