Abstract

Current-voltage dependence is measured in (Ga,Sb)-doped ZnO up to 150 kV/cm electric fields. A channel temperature is controlled by applying relatively short (few ns) voltage pulses to two-terminal samples. The dependence of electron drift velocity on electron density ranging from 1.42×\times1017^{17} cm−3^{-3} to 1.3×\times1020^{20} cm−3^{-3} at a given electric field is deduced after estimation of the sample contact resistance and the Hall electron mobility. Manifestation of the highest electron drift velocity up to ∼\sim1.5×\times107^{7} cm/s is estimated for electron density of 1.42×\times1017^{17} cm−3^{-3} and is in agreement with Monte Carlo simulation when hot-phonon lifetime is below 1 ps. A local drift velocity maximum is observed at ∼\sim1.1×\times1019^{19} cm−3^{-3} and is in agreement with ultra-fast hot phonon decay.

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