Abstract
We study the speed/fidelity trade-off for a two-qubit phase gate implemented in Ca hyperfine trapped-ion qubits. We characterize various error sources contributing to the measured fidelity, allowing us to account for errors due to single-qubit state preparation, rotation and measurement (each at the level), and to identify the leading sources of error in the two-qubit entangling operation. We achieve gate fidelities ranging between (for a gate time s) and (for s), representing respectively the fastest and lowest-error two-qubit gates reported between trapped-ion qubits by nearly an order of magnitude in each case.
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