Dynamic synchrotron X-ray imaging study of effective temperature in a vibrated granular medium

preprint2014arXivOpen access

Abstract

We present a dynamic synchrotron X-ray imaging study of the effective temperature TeffT_{eff} in a vibrated granular medium. By tracking the directed motion and the fluctuation dynamics of the tracers inside, we obtained TeffT_{eff} of the system using Einstein relation. We found that as the system unjams with increasing vibration intensities ΓΓ, the structural relaxation time ττ increases substantially which can be fitted by an Arrhenius law using TeffT_{eff}. And the characteristic energy scale of structural relaxation yielded by the Arrhenius fitting is E=0.21±0.02E = 0.21 \pm 0.02 pd3pd^3, where pp is the pressure and dd is the background particle diameter, which is consistent with those from hard sphere simulations in which the structural relaxation happens via the opening up of free volume against pressure.

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