Abstract
Turn-By-Turn (TBT) betatron oscillation data is a very powerful tool in studying machine optics. Hundreds and thousands of turns of free oscillations are taken in just few tens of milliseconds. With beam covering all positions and angles at every location TBT data can be used to diagnose focusing errors almost instantly. This paper describes a new approach that observes focusing error collectively over all available TBT data to find the optimized quadrupole strength, one location at a time. Example will be shown and other issues will be discussed.
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