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Analytical view on non-invasive measurement of moving charge by position-based semiconductor qubit(s)

Detection of moving charge in free space is presented in the framework of single electron CMOS devices. It opens the perspective for construction of new type detectors for beam diagnostic in accelerators or for the detection of solar wind. General phenomenological model of noise acting on position based qubit implemented in semiconductor quantum dots is given in the framework of simplistic tight-binding model. Furthermore the effect of accelerator beam on the system of 2 electrostatically coupled qubits is formulated by tight-binding equations. The position based qubits of various topologies are described as quantum detectors of moving electric charge. Keywords: tight-binding model, position-based qubit, non-invasive quantum measurement, quantum decoherence of qubit system, accelerator beam diagnostics, electrostatic noise, phase rotating gate, roton position-based qubit