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A simple and robust method for characterization of afterpulsing in single photon detectors

Single photon detectors are important for a wide range of applications each with their own specific requirements, which makes necessary the precise characterization of detectors. Here, we present a simple and accurate methodology of characterizing dark count rate, detection efficiency, and after-pulsing in single photon detectors purely based on their counting statistics. We demonstrate our new method on a custom-made, free-running single photon detector based on an InGaAs based avalanche photo diode (APD), though the methodology presented here is applicable for any type of single photon detector.

preprint2014arXivOpen access
Gerhard HumerMomtchil PeevChristoph SchaeffSven RamelowMario StipčevićRupert Ursin
quant-ph
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Open access6 authors1 topic
Imported metadata coverageMissing code, dataset, citation and institution fields are tracked without dominating the paper.Details
Citations: 0Reviews: 0Saves: 0Code: not linkedDataset: not linkedInstitutions: 0

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Gerhard HumerMomtchil PeevChristoph SchaeffSven RamelowMario StipčevićRupert Ursin

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