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A New Heterodyne Megasonic Piezoresponse Force Microscopy with High-frequency Excitation beyond 100 MHz

Piezoresponse Force Microscopy (PFM), as a powerful nanoscale characterization technique, has been extensively utilized to elucidate diverse underlying physics of ferroelectricity. However, the intensive study of conventional PFM has revealed a growing number of concerns and limitations which are largely challenging its validity and application. Herein, we developed a new advanced PFM technique, named Heterodyne Megasonic Piezoresponse Force Microscopy (HM-PFM), which uniquely uses 106 to 108 Hz high-frequency excitation and heterodyne method to measure the piezoelectric strain at nanoscale. We report that HM-PFM can unambiguously provide standard ferroelectric domain and hysteresis loop measurements, and an effective domain characterization with excitation frequency up to ~110 MHz has been realized. Most importantly, owing to the high-frequency and heterodyne scheme, the contributions from both electrostatic force and electrochemical strain can be significantly minimized in HM-PFM. Furthermore, a special difference-frequency piezoresponse frequency spectrum (DFPFS) measurement is developed on HM-PFM and a distinct DFPFS characteristic is observed on the materials with piezoelectricity. It is believed that HM-PFM can be an excellent candidate for the piezoelectric or ferroelectric studies where the conventional PFM results are highly controversial.