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Z. Pastuovic
Researcher
PaperSemiconductor characterization by scanning ion beam induced charge (IBIC) microscopyAuthorship / preprint / 2016PaperCharge collection efficiency mapping of interdigitated 4H-SiC detectorsAuthorship / preprint / 2016PaperFocused ion beam fabrication and IBIC characterization of a diamond detector with buried electrodesAuthorship / preprint / 2016PaperMonte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottky diodeAuthorship / preprint / 2016PaperPractical applications of quantum sensing: a simple method to enhance sensitivity of Nitrogen-Vacancy-based temperature sensorsAuthorship / preprint / 2019PaperDirect fabrication of three-dimensional buried conductive channels in single crystal diamond with ion microbeam induced graphitizationAuthorship / preprint / 2016