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Thomas Poehlsen
Researcher
PaperCharge losses in segmented silicon sensors at the Si-SiO2 interfaceAuthorship / preprint / 2012PaperTime dependence of charge losses at the Si-SiO2 interface in p+n-silicon strip sensorsAuthorship / preprint / 2013PaperStudy of the accumulation layer and charge losses at the Si-SiO2 interface in p+n-silicon strip sensorsAuthorship / preprint / 2013PaperChallenges for Silicon Pixel Sensors at the European XFELAuthorship / preprint / 2012PaperStudy of X-ray Radiation Damage in Silicon SensorsAuthorship / preprint / 2011