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Tetsuo Hatakeyama
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Tetsuo Hatakeyama4 visible / 4 total nodes / 3 links

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AuthorshipAuthorshipAuthorshipTetsuo HatakeyamaATetsuo HatakeyamaResearcherCharacterization of Traps at Nitrided SiO$_2$/SiC Interfaces near the Conduction Band Edge by using Hall Effect MeasurementsWCharacterization of Tra...preprint / 2017Dipole Scattering at the Interface: The Origin of Low Mobility observed in SiC MOSFETsWDipole Scattering at th...preprint / 2022Characterization of Interface Traps in SiO$_2$/SiC Structures Close to the Conduction Band by Deep-Level Transient SpectroscopyWCharacterization of Int...preprint / 2014
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Tetsuo Hatakeyama

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PaperCharacterization of Traps at Nitrided SiO2_2/SiC Interfaces near the Conduction Band Edge by using Hall Effect MeasurementsAuthorship / preprint / 2017PaperDipole Scattering at the Interface: The Origin of Low Mobility observed in SiC MOSFETsAuthorship / preprint / 2022PaperCharacterization of Interface Traps in SiO2_2/SiC Structures Close to the Conduction Band by Deep-Level Transient SpectroscopyAuthorship / preprint / 2014

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